Plassys Evaporator: Difference between revisions
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== Overview == | == Overview == | ||
Physical vapor deposition tool of aluminum via e-beam evaporation for Josephson junction fabrication. | |||
The system has the capability of in-situ oxidation . | It also provides an ion gun for surface preparation and etching purposes. | ||
The system has the capability of in-situ oxidation . | |||
Film Quality : AFM Analysis for surface roughness is 1.6 nm for 100nm thickness film ( scan area 2 um) | |||
== Currently loaded materials == | == Currently loaded materials == |
Revision as of 09:14, 20 June 2023
Overview
Physical vapor deposition tool of aluminum via e-beam evaporation for Josephson junction fabrication. It also provides an ion gun for surface preparation and etching purposes. The system has the capability of in-situ oxidation .
Film Quality : AFM Analysis for surface roughness is 1.6 nm for 100nm thickness film ( scan area 2 um)
Currently loaded materials
Substrates allowedSilicon and Sapphire only |