Plassys Evaporator: Difference between revisions
Jump to navigation
Jump to search
Line 9: | Line 9: | ||
== Currently loaded materials == | == Currently loaded materials == | ||
{| | {| class="wikitable" | ||
|- | |- | ||
! Crucible position!! Material!! Comment | |||
|- | |- | ||
| 1 || Ti || Currently In Use | |||
|- | |- | ||
| | | 2 || - || Empty | ||
| | |||
| | |||
|- | |- | ||
| | | 3 || -|| Empty | ||
| | |||
| | |||
|- | |- | ||
| | | 4 || Al || NBI crucible | ||
| Al | |||
| | |||
|- | |- | ||
| | | 5 || Al || NQCP crucible | ||
| Al | |||
| | |||
|} | |} | ||
Revision as of 12:09, 9 September 2025
Overview
Physical vapor deposition tool of aluminum via e-beam evaporation for Josephson junction fabrication. It also provides an ion gun for surface preparation and etching purposes. The system has the capability of in-situ oxidation .
Film Quality : Surface roughness - 1.6 nm for 100nm thick film ( scan area 2 um /AFM Analysis ( June 2023)
Currently loaded materials
Crucible position | Material | Comment |
---|---|---|
1 | Ti | Currently In Use |
2 | - | Empty |
3 | - | Empty |
4 | Al | NBI crucible |
5 | Al | NQCP crucible |
Substrates allowed
Silicon and Sapphire only