JEOL 7800F

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The JEOL 7800F SEM is located in the basement in the room K08. The tool has a primary and a supporting Caar - Petur and Nader, respectively. The SEM is equipped with the following detectors:

  • an Inlens detector, referred to as the UED (Upper electron detector)
  • an SE2 detector, referred to as the LED (Lower electron detector)
  • a back scattered electron detector, BSED
  • an EDS (Energy dispersion X-ray detector)

The following manual is split up into three workflows:

  • Loading your sample
  • Beam conditioning
  • Unloading your sample

Additionally, the sections are divided into basic, intermediate and advanced parts.


Here we go:

Loading the sample

Beam conditioning

Unloading your sample