Critical point dryer

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Critical point dryer
Picture of Critical point dryer text
Essentials
Full nameCritical Point Dryer Leica EM CPD300
ManufacturerLeica
DescriptionCritical point dryer
LocationCleanroom 2 (03.2.203B)
Responsibility
PrimaryZhe

CPD introduction and usage guidelines

  • The procedure of critical point drying is an efficient method for drying delicate samples for SEM applications. It preserves the surface structure of a specimen which could otherwise be damaged due to surface tension when changing from the liquid to gaseous state.
  • This tool belongs to Quantum Photonics group, and is available for all cleanroom users. Please write to the cleanroom staff (cleanroom@nbi.dk) to ask for training and access.