JEOL 7800F: Difference between revisions
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* a back scattered electron detector, BSED | * a back scattered electron detector, BSED | ||
* an EDS (Energy dispersion X-ray detector) | * an EDS (Energy dispersion X-ray detector) | ||
The following manual is split up into three workflows: | |||
* Loading your sample | |||
* Beam conditioning | |||
* Unloading your sample | |||
Additionally, the sections are divided into basic, intermediate and advanced parts. | |||
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Here we go: | |||
== Loading the sample == | |||
== Beam conditioning == | |||
== Unloading your sample == | |||
Revision as of 09:28, 30 November 2015
The JEOL 7800F SEM is located in the basement in the room K08. The tool has a primary and a supporting Caar - Petur and Nader, respectively. The SEM is equipped with the following detectors:
- an Inlens detector, referred to as the UED (Upper electron detector)
- an SE2 detector, referred to as the LED (Lower electron detector)
- a back scattered electron detector, BSED
- an EDS (Energy dispersion X-ray detector)
The following manual is split up into three workflows:
- Loading your sample
- Beam conditioning
- Unloading your sample
Additionally, the sections are divided into basic, intermediate and advanced parts.
Here we go: