Philips TEM: Difference between revisions
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[[Category:Tools]] | [[Category:Tools]] | ||
[[Category:Characterization]] | [[Category:Characterization]] | ||
Thermo Fisher Scientific Talos F200i S/TEM is a versatile 200-kV field-emission (scanning) transmission electron microscope designed for high-throughput, high resolution materials characterization in multi-user research environments. | |||
Combining TEM and STEM imaging modes, it enables sub-nanometer structural and chemical analysis, including advanced techniques such as EDS mapping, diffraction and 4D-STEM. | |||
The facility additionally provides focused (Ga) ion beam (FIB) capabilities for site-specific sample preparation, enabling precise lamella fabrication and cross-sectioning to support advanced S/TEM workflows. | |||
'''💡Questions?''' | |||
For more information, kindly contact NBI-Cleanroom staff. | |||
Latest revision as of 16:54, 10 April 2026
 | |
| Essentials | |
|---|---|
| Full name | Talos F200i S/TEM |
| Manufacturer | Thermo Fisher Scientific |
| Description | Electron microscope |
| Responsibility | |
| Primary | Martin |
| Secondary | Nikki |
Thermo Fisher Scientific Talos F200i S/TEM is a versatile 200-kV field-emission (scanning) transmission electron microscope designed for high-throughput, high resolution materials characterization in multi-user research environments.
Combining TEM and STEM imaging modes, it enables sub-nanometer structural and chemical analysis, including advanced techniques such as EDS mapping, diffraction and 4D-STEM.
The facility additionally provides focused (Ga) ion beam (FIB) capabilities for site-specific sample preparation, enabling precise lamella fabrication and cross-sectioning to support advanced S/TEM workflows.
💡Questions?
For more information, kindly contact NBI-Cleanroom staff.