Philips TEM: Difference between revisions
Jump to navigation
Jump to search
No edit summary |
No edit summary |
||
| (6 intermediate revisions by 2 users not shown) | |||
| Line 1: | Line 1: | ||
{{Infobox tool | {{Infobox tool | ||
|image = | |image = Talos F200i.jpg | ||
|toolfullname = | |toolfullname = Talos F200i S/TEM | ||
|website = https://www. | |website = https://www.thermofisher.com | ||
|company = | |company = Thermo Fisher Scientific | ||
|description = | |description = Electron microscope | ||
|primary = Martin | |||
|primary = | |secondary = Nikki | ||
|secondary = | |||
}} | }} | ||
[[Category:Tools]] | |||
[[Category:Characterization]] | |||
Thermo Fisher Scientific Talos F200i S/TEM is a versatile 200-kV field-emission (scanning) transmission electron microscope designed for high-throughput, high resolution materials characterization in multi-user research environments. | |||
Combining TEM and STEM imaging modes, it enables sub-nanometer structural and chemical analysis, including advanced techniques such as EDS mapping, diffraction and 4D-STEM. | |||
The facility additionally provides focused (Ga) ion beam (FIB) capabilities for site-specific sample preparation, enabling precise lamella fabrication and cross-sectioning to support advanced S/TEM workflows. | |||
'''💡Questions?''' | |||
For more information, kindly contact NBI-Cleanroom staff. | |||
Latest revision as of 16:54, 10 April 2026
| Essentials | |
|---|---|
| Full name | Talos F200i S/TEM |
| Manufacturer | Thermo Fisher Scientific |
| Description | Electron microscope |
| Responsibility | |
| Primary | Martin |
| Secondary | Nikki |
Thermo Fisher Scientific Talos F200i S/TEM is a versatile 200-kV field-emission (scanning) transmission electron microscope designed for high-throughput, high resolution materials characterization in multi-user research environments.
Combining TEM and STEM imaging modes, it enables sub-nanometer structural and chemical analysis, including advanced techniques such as EDS mapping, diffraction and 4D-STEM.
The facility additionally provides focused (Ga) ion beam (FIB) capabilities for site-specific sample preparation, enabling precise lamella fabrication and cross-sectioning to support advanced S/TEM workflows.
💡Questions?
For more information, kindly contact NBI-Cleanroom staff.