JEOL 7800F - Revision history

Zhe at 19:58, 7 November 2025

2025-11-07T19:58:57Z

← Older revision		Revision as of 19:58, 7 November 2025
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	\|location = 03.1.K08		\|location = 03.1.K08
	\|primary = Nader		\|primary = Nader
			\|secondary = Nikki
	\|manual = A printed version is in a blue binder by the instrument		\|manual = A printed version is in a blue binder by the instrument
	}}		}}

Karolis: /* Remote access */

2022-05-03T09:37:38Z

Remote access

← Older revision		Revision as of 09:37, 3 May 2022
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	; Drifty image?		; Drifty image?
	: Chiller water needs to be topped up. Contact [mailto:cleanroom@nbi.ku.dk cleanroom@nbi.ku.dk].		: Chiller water needs to be topped up. Contact [mailto:cleanroom@nbi.ku.dk cleanroom@nbi.ku.dk].

			== Remote access ==
			* TeamViewer: JEOL7800F
			* LogMeIn: JEOL7800F_XFER_PC (BASEMENT)

	== Resources ==		== Resources ==

Karolis: /* Resources */ added small troubleshooting section

2022-05-03T08:35:08Z

Resources: added small troubleshooting section

← Older revision		Revision as of 08:35, 3 May 2022
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	There are two focusing regimes in the SEM; At working distances below ~5.5 mm, the beam will be focused with both an electrostatic and magnetic lens system. Above this working distance, the electrostatic lens is switched off. There is thus a discontinuity at this switching point, and is clearly visible as a "jump" in the image, and you should thus avoid positioning your sample surface there.		There are two focusing regimes in the SEM; At working distances below ~5.5 mm, the beam will be focused with both an electrostatic and magnetic lens system. Above this working distance, the electrostatic lens is switched off. There is thus a discontinuity at this switching point, and is clearly visible as a "jump" in the image, and you should thus avoid positioning your sample surface there.

			== Troubleshooting ==
			; Photo button doesn't work?
			: Restart PC.
			; Drifty image?
			: Chiller water needs to be topped up. Contact [mailto:cleanroom@nbi.ku.dk cleanroom@nbi.ku.dk].
	== Resources ==		== Resources ==

Karolis: added eLine as an alternative

2022-04-09T21:39:06Z

added eLine as an alternative

← Older revision		Revision as of 21:39, 9 April 2022
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	}}		}}

	The JEOL 7800F is a 30 kV field emission scanning electron microscope (SEM). It is equipped with two [https://en.wikipedia.org/wiki/Everhart-Thornley_detector secondary electron detectors] a backscatter detector, and a EDS detector. It has a eucentric stage, a range of different sample holders depending on application requirements, and can accommodate samples of up to 50 mm in diameter. A unique feature of this SEM, is its ability to place a negative bias on the sample stage in order to decelerate incoming electrons as well as to eject secondary electrons, thereby increasing the signal-to-noise ratio. This feature is known as gentle beam (GB), and is particularly useful when working at low acceleration voltages.		The JEOL 7800F is a 30 kV field emission scanning electron microscope (SEM).
			It is equipped with two [https://en.wikipedia.org/wiki/Everhart-Thornley_detector secondary electron detectors] a backscatter detector, and a EDS detector.
			It has a eucentric stage, a range of different sample holders depending on application requirements, and can accommodate samples of up to 50 mm in diameter.
			A unique feature of this SEM, is its ability to place a negative bias on the sample stage in order to decelerate incoming electrons as well as to eject secondary electrons, thereby increasing the signal-to-noise ratio.
			This feature is known as gentle beam (GB), and is particularly useful when working at low acceleration voltages.

			[[Raith eLine]] is an alternative to this tool.
			It does not have beam deceleration capability, but supports scripting such as unattended imaging.
			Repetitive imaging at predetermined locations should be carried out on that tool instead.

	== Overview ==		== Overview ==

Karolis at 19:42, 6 April 2022

2022-04-06T19:42:14Z

← Older revision		Revision as of 19:42, 6 April 2022
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	[[Category:Tools]]		[[Category:Tools]]
			[[Category:Characterization]]

Karolis: /* Dynamic focus */ typo

2020-02-17T18:36:39Z

Dynamic focus: typo

← Older revision		Revision as of 18:36, 17 February 2020
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	=== Dynamic focus ===		=== Dynamic focus ===

	When imaging samples at a high tilt, you may find that the depth of focus is not sufficient. You can compensate for this by checking the "~~Dyanmic~~ Focus" box in the lower middle of PC-SEM, and using the tool in the drop-menu below to set the focus in two regions of your sample surface. When scanning, the SEM will use interpolation to attempt to keep the beam focused along the sample surface.		When imaging samples at a high tilt, you may find that the depth of focus is not sufficient. You can compensate for this by checking the "Dynamic Focus" box in the lower middle of PC-SEM, and using the tool in the drop-menu below to set the focus in two regions of your sample surface. When scanning, the SEM will use interpolation to attempt to keep the beam focused along the sample surface.

	=== Refocusing after inserting the BSD ===		=== Refocusing after inserting the BSD ===

Karolis: fixed heading levels, updated infobox

2019-02-12T15:43:15Z

fixed heading levels, updated infobox

Show changes

Shiv at 15:26, 7 July 2018

2018-07-07T15:26:45Z

← Older revision		Revision as of 15:26, 7 July 2018
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	\|description = Scanning electron microscope		\|description = Scanning electron microscope
	\|location = 03.1.K08		\|location = 03.1.K08
	\|primary = ~~Pétur~~		\|primary = Nader
	\|secondary = ~~Nader~~		\|secondary = Shiv
	\|limits = 2 hours per day during office hours		\|limits = 2 hours per day during office hours
	\|computer = TBD		\|computer = TBD

Petur: /* Unloading */

2017-04-27T12:18:10Z

Unloading

← Older revision		Revision as of 12:18, 27 April 2017
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	= Unloading =		= Unloading =

	When you're done with the SEM, turn off the beam, and retract the BSD if applicable, and then press the "Spec. Exchange" button. It will move the stage to the loading/unloading position (X,Y,R,T = 0, Z = 40 mm). Once it's done, the button will become green [[File:JEOL 7800F specimen exchange.png]] and it is safe to transfer the sample holder from the chamber to the loadlock using the loading rod as described above.		When you're done with the SEM, turn off the beam, and retract the BSD if applicable, and then press the "Spec. Exchange" button. It will move the stage to the loading/unloading position (X,Y,R,T = 0, Z = 40 mm). Once it's done, the button will become green [[File:JEOL 7800F specimen exchange.png]] and it is safe to transfer the sample holder from the chamber to the loadlock using the loading rod as described above. Once in the loadlock, you can vent the loadlock to retrieve your sample. '''Leave the loadlock pumped down'''. Fill in the log-book, and transfer your files from the SEM PC to e.g. the ZDrive.

	= Tips and tricks =		= Tips and tricks =

Petur: /* Unloading */

2017-04-27T12:12:33Z

Unloading

← Older revision		Revision as of 12:12, 27 April 2017
Line 156:		Line 156:
	= Unloading =		= Unloading =

	When you're done with the SEM, turn off the beam, and retract the BSD if applicable, and then press the "Spec. Exchange" button. It will move the stage to the loading/unloading position (X,Y,R,T = 0, Z = 40 mm). Once it's done, the button will become green ~~(shown)~~ [[File:JEOL 7800F specimen exchange.png]] and it is safe to transfer the sample holder from the chamber to the loadlock using the loading rod as described above.		When you're done with the SEM, turn off the beam, and retract the BSD if applicable, and then press the "Spec. Exchange" button. It will move the stage to the loading/unloading position (X,Y,R,T = 0, Z = 40 mm). Once it's done, the button will become green [[File:JEOL 7800F specimen exchange.png]] and it is safe to transfer the sample holder from the chamber to the loadlock using the loading rod as described above.

	= Tips and tricks =		= Tips and tricks =